Resolution: standard / high
Figure 6.
Fractogram of materials present in the 450 nm filtrate of nano-CuO (A) and nano-ZnO
(B) as assessed by ICP-MS and UV signal under FlFFF condition I (Table 1). Elution particle size was adjusted by the void peak.
Gajjar et al. Journal of Biological Engineering 2009 3:9 doi:10.1186/1754-1611-3-9
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